A filter based analyzer for studies of X-ray Raman scattering

Non-resonant X-ray Raman scattering (XRS) with hard X-rays holds the potent ial for measuring local structure and local electronic properties around lo w-Z atoms in environments where traditional soft X-ray techniques are inapp licable. However, the small cross-section for XRS requires that experiments must simultaneously achieve high detection efficiency, large collection so lid angles, and good energy resolution. We report here that a simple X-ray analyzer consisting of an absorber and a point-focusing spatial filter can be used to study some X-ray Raman near-edge features. This apparatus has gr eater than 10% detection efficiency, has an energy resolution of 8 eV, and can be readily extended to collection angles of more than 1 sr. We present preliminary measurements of the XRS from the nitrogen 1 s shell in pyroliti c boron nitride. (C) 2001 Elsevier Science B.V. All rights reserved.