Identification of acquisition parameters from the point spread function ofa fluorescence microscope

Citation
O. Haeberle et al., Identification of acquisition parameters from the point spread function ofa fluorescence microscope, OPT COMMUN, 196(1-6), 2001, pp. 109-117
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS COMMUNICATIONS
ISSN journal
00304018 → ACNP
Volume
196
Issue
1-6
Year of publication
2001
Pages
109 - 117
Database
ISI
SICI code
0030-4018(20010901)196:1-6<109:IOAPFT>2.0.ZU;2-K
Abstract
Except for blind methods, deconvolution of 3-D data sets acquired from a fl uorescence microscope requires the knowledge of the point spread function ( PSF) of the instrument. Using the XCOSM package, we show first with simulat ions and then with recorded data that it is possible to recover from an exp erimental PSF some parameters, which are very difficult or impossible to me asure during the acquisition, like the specimen depth or the immersion medi um refractive index. Doing so, we can precise the acquisition protocol, whi ch helps to use the instrument under optimal conditions. Furthermore, the k nowledge of the actual acquisition conditions permits to use for the deconv olution process a computed PSF, which is noiseless and as close as possible to the actual PSF. This helps to reduce errors in quantitative measurement s after deconvolution, as shown with computations. (C) 2001 Elsevier Scienc e B.V. All rights reserved.