O. Haeberle et al., Identification of acquisition parameters from the point spread function ofa fluorescence microscope, OPT COMMUN, 196(1-6), 2001, pp. 109-117
Except for blind methods, deconvolution of 3-D data sets acquired from a fl
uorescence microscope requires the knowledge of the point spread function (
PSF) of the instrument. Using the XCOSM package, we show first with simulat
ions and then with recorded data that it is possible to recover from an exp
erimental PSF some parameters, which are very difficult or impossible to me
asure during the acquisition, like the specimen depth or the immersion medi
um refractive index. Doing so, we can precise the acquisition protocol, whi
ch helps to use the instrument under optimal conditions. Furthermore, the k
nowledge of the actual acquisition conditions permits to use for the deconv
olution process a computed PSF, which is noiseless and as close as possible
to the actual PSF. This helps to reduce errors in quantitative measurement
s after deconvolution, as shown with computations. (C) 2001 Elsevier Scienc
e B.V. All rights reserved.