F. Richomme et al., Structural and magnetic properties of UHV-evaporated Fe/Tb multilayers: Effect of the substrate temperature - art. no. 094415, PHYS REV B, 6409(9), 2001, pp. 4415
Two series of (Fe/Tb)(20) multilayers deposited at two temperatures (150 K
and 300 K) were investigated at room temperature by x-ray diffraction, conv
ersion electron Mossbauer spectrometry, and magnetic measurements. The Fe l
ayer thickness is varying in a large range (0.9-5.3 nm), while the Th layer
thickness is fixed to 1.9 nm. Because of the two different types of amorph
ous modulated structures obtained at the two deposition temperatures, the c
rystallization of the Fe layers occurs following two different processes fo
r the two series. Then, when the Fe layers are crystallized, experimental M
ossbauer and magnetic results indicate a similar layered structure with the
same extension for the Fe-Tb inter-faces at the same Fe thickness. For bot
h series, when the crystallization of the Fe layers occurs, an enhancement
of the perpendicular magnetic anisotropy (PMA) produced by a sharpening of
the interfaces is evidenced. The strong PMA observed in the thinner (bcc-Fe
/Tb) multilayers grown at 300 K comes from the dominant interface anisotrop
y compared to the volume anisotropy due to the thin bcc-Fe thickness. For (
bcc-Fe/Tb) multilayers the variation of the saturation magnetization as a f
unction of the Fe thickness allows us to quantify the different magnetic zo
nes inside the multilayers. The deduced anisotropy constants for the interf
aces and the volume are K-S = 2.32 mJ/m(2) and K-upsilon = -1.76x10(6) J/m(
3).