Time-resolved X-ray diffraction study of C-60 at high pressure and temperature

Authors
Horikawa, T Suito, K Kobayashi, M Onodera, A
Citation
T. Horikawa et al., Time-resolved X-ray diffraction study of C-60 at high pressure and temperature, PHYS LETT A, 287(1-2), 2001, pp. 143-151
Citations number
22
Categorie Soggetti
Physics
Journal title
PHYSICS LETTERS A
ISSN journal
03759601 → ACNP
Volume
287
Issue
1-2
Year of publication
2001
Pages
143 - 151
Database
ISI
SICI code
0375-9601(20010820)287:1-2<143:TXDSOC>2.0.ZU;2-N
Abstract
Energy-dispersive X-ray diffraction measurements on C-60 were undertaken at every 1-10 min interval while high temperature (200-800 degreesC) was held constant for at longest 3 h under pressures of 12.5 and 14.3 GPa. The resu lts from this and additional experiments have provided an insight into the time, pressure, and temperature dependency of the fullerene-derived superha rd materials. (C) 2001 Elsevier Science B.V. All rights reserved.