Applications of dynamical diffraction under locally plane wave conditions:defects in nearly perfect crystals and X-ray refractometry

In a previous paper, the concept of a locally plane wave was explained theo retically. In such a configuration, the fringe pattern recorded on the film can be considered as a phase analyser. Here the experimental analysis is p resented, showing examples of interesting applications to X-ray refractomet ry and to the visualization of the strain field around isolated defects.