Attenuated total reflection design for in situ FT-IR spectroelectrochemical studies

Citation
H. Visser et al., Attenuated total reflection design for in situ FT-IR spectroelectrochemical studies, ANALYT CHEM, 73(17), 2001, pp. 4374-4378
Citations number
30
Categorie Soggetti
Chemistry & Analysis","Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ANALYTICAL CHEMISTRY
ISSN journal
00032700 → ACNP
Volume
73
Issue
17
Year of publication
2001
Pages
4374 - 4378
Database
ISI
SICI code
0003-2700(20010901)73:17<4374:ATRDFI>2.0.ZU;2-L
Abstract
A versatile spectroelectrochemical apparatus is introduced to study the cha nges in IR spectra of organic and inorganic compounds upon oxidation or red uction. The design is based on an attenuated total reflection device, which permits the study of a wide spectral range of 16 700 (600 nm)-250 cm(-1),w ith a small opaque region of 2250-1900 cm(-1). In addition, an IR data coll ection protocol is introduced to deal with electrochemically nonreversible background signals. This method is tested with ferrocene in acetonitrile; c oncentrations as low as 1 mM produce results that agree with those in the l iterature.