Formation of three-dimensional microstructures by electrochemical etching of silicon

Citation
P. Kleimann et al., Formation of three-dimensional microstructures by electrochemical etching of silicon, APPL PHYS L, 79(11), 2001, pp. 1727-1729
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
11
Year of publication
2001
Pages
1727 - 1729
Database
ISI
SICI code
0003-6951(20010910)79:11<1727:FOTMBE>2.0.ZU;2-J
Abstract
This letter describes the promising technique of micromachining using the p roperties of electrochemical etching of (100)-oriented n-type silicon in a hydrofluoric acid electrolyte. The technique is based on electropolishing o f a wafer except for areas where vertical structures are needed and does no t require a periodic pattern. Predefined steps of a few microns depth prior to the electrochemical etching define the shape and position of the struct ures. The three-dimensional microstructure width can be adjusted with the e tching parameters, also enabling the formation of free-standing structures. The feasibility of this technique is demonstrated by forming high aspect r atio microneedles and tubes. (C) 2001 American Institute of Physics.