A parametric study of high density plasma etching of Y-Ba-Cu-O films was ca
rried out in a planar-type inductively coupled plasma (ICP) etcher. The etc
h rate was a strong function of ICP source power, radio frequency chuck pow
er, and reactor pressure, Practical etch rates of 2500-3500 Angstrom /min w
ere obtained at moderate ICP conditions. The transition temperature (T-c) o
f the superconductor did not deteriorate during the ICP etch process, and w
as about 87 K. Etch results showed that ICP etching is a promising techniqu
e for patterning high T-c superconducting films into devices. (C) 2001 The
Electrochemical Society.