CHARACTERIZATION OF PHOSPHATE FILMS ON ALUMINUM SURFACES

Citation
B. Cheng et al., CHARACTERIZATION OF PHOSPHATE FILMS ON ALUMINUM SURFACES, Journal of materials engineering and performance, 6(4), 1997, pp. 405-412
Citations number
38
Categorie Soggetti
Material Science
ISSN journal
10599495
Volume
6
Issue
4
Year of publication
1997
Pages
405 - 412
Database
ISI
SICI code
1059-9495(1997)6:4<405:COPFOA>2.0.ZU;2-I
Abstract
A thin layer of phosphate conversion coating was formed on pure alumin um in a commercial zinc-manganese phosphating bath. A number of surfac e analytical techniques were used to characterize the phosphate thin f ilms formed after immersion times ranging from 30 s to 10 min. The coa ting contained mainly a crystalline structure with dispersed micromete r-scale cavities. The major constituents of the phosphate film were zi nc, phosphorus, and oxygen; a small amount of manganese was also detec ted. Based on these results, a three-stage mechanism was proposed for the formation and the growth of phosphate conversion coatings on alumi num. Electrochemical impedance spectroscopy was used to evaluate the c orrosion performance of phosphated and uncoated aluminum samples in 0. 50 M Na2SO4 and 0.10 M H2SO4 solutions. Both types of samples exhibite d a passive state in the neutral solution and general corrosion behavi or in the acid solution.