Arc root commutation from moving contacts in low voltage devices

Citation
Jw. Mcbride et al., Arc root commutation from moving contacts in low voltage devices, IEEE T COMP, 24(3), 2001, pp. 331-336
Citations number
19
Categorie Soggetti
Material Science & Engineering
Journal title
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES
ISSN journal
15213331 → ACNP
Volume
24
Issue
3
Year of publication
2001
Pages
331 - 336
Database
ISI
SICI code
1521-3331(200109)24:3<331:ARCFMC>2.0.ZU;2-H
Abstract
This paper focus on the arc commutation from a moving contact and in partic ular on the anode motion of a high current arc in low voltage current limit ing circuit breakers. Recent investigations have observed that the anode ar e root motion is affected by are chamber geometry. It was previously assume d that cathode root motion was the dominant process. The study uses a flexi ble test apparatus with a solid state high speed imaging system. The experi mental results presented show the influence of are chamber venting, current level, current polarity and contact velocity on are motion. Particular emp hasis is made to the anode motion. The physical process occurring in the an ode root are discussed and related to the observed motion. The results show that the anode root is retarded at the tip of the moving contact and that this is primarily related to the venting process in the are chamber.