T. Yamada et al., Evaluation of organic monolayers formed on Si(111): Exploring the possibilities for application in electron beam nanoscale patterning, JPN J A P 1, 40(8), 2001, pp. 4845-4853
The methods of preparing organic monolayers on Si(111). the effects of elec
tron-beam irradiation onto these monolayers. and the deposition of metal at
oms over the irradiated areas have been investigated in order to develop a
process of mass-scale production of nanometer-scale patterns on Si(111) waf
er surfaces. The organic monolayers were fabricated on hydrogen-terminated
Si(111) wafer surfaces using previously reported methods for the electrolys
is of para-substituted benzenediazoniurn salts and the Grignard reaction wi
th various alkyl moieties and reaction procedures. Using these electrolysis
methods, partially well-defined two-dimensional monolayers were formed, wh
ich were, however, obscured by precipitated by-products. The Grignard react
ion deposited homogeneous monolayer moieties of alkyl groups which were ran
domly arranged and are suitable for surface passivation. Electron-beam bomb
ardment of the organic monolayers on Si(111) was performed in an atmosphere
of O-2 or H2O. The bombarded area was effectively oxidized in a well-contr
olled manner. By immersing the bombarded specimen into an aqueous NiSO4 + (
NH4)(2)SO4 solution, Ni was selectively impregnated only within the area of
electron bombardment. Based on these results, application of organic monol
ayers for fabricating nanometer-scale monolayer patterns is proposed.