Impact excitation of carriers in diamond under extremely high electric fields

Citation
T. Watanabe et al., Impact excitation of carriers in diamond under extremely high electric fields, JPN J A P 2, 40(7B), 2001, pp. L715-L717
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
40
Issue
7B
Year of publication
2001
Pages
L715 - L717
Database
ISI
SICI code
Abstract
Impact ionization process in diamond under extremely high electric fields ( EFs) has been investigated. The impact-ionization rate was calculated theor etically from Fermi's golden rule using the full band structure. It is foun d from Monte Carlo simulations that the impact ionization of carriers occur s at high EFs above 1 x 10(6) V/cm. The threshold EF for ionization is smal ler for hole than for electron. Current(I)-voltage(V) characteristics measu red for p-i-p diamond stacking structures revealed that I is approximately proportional to V-2 with substantial electroluminescence at EFs higher than 5 x 10(6) V/cm, being in good agreement with the theoretically predicted v alues.