We have explored the superior radiation tolerance of metal organic chemical
vapor deposition (MOCVD) grown, low bandgap, (0.95 eV) InGaAsP solar cells
as compared to GaAs-on-Ge cells, after 1 MeV electron irradiation. The min
ority carder injection due to forward bias and light illumination under low
concentration ratio, can lead to enhanced recovery of radiation damage in
InGaAsP n(+)-p junction solar cells. An injection anneal activation energy
(0.58 eV) of the defects involved in damage/recovery of the InGaAsP solar c
ells has been estimated from the resultant recovery of the solar cell prope
rties following minority carrier injection. The results suggest that low ba
ndgap radiation resistant InGaAsP (0.95 eV) lattice matched to InP substrat
es provide an alternative to use as bottom cells in multi-junction solar ce
lls instead of less radiation ressitant conventional GaAs based solar cells
for space applications.