S. Nakatani et al., Study of the Si(111) "5 x 5"-Cu surface structure by X-ray diffraction andscanning tunneling microscopy, JPN J A P 2, 40(7A), 2001, pp. L695-L697
The quasi-"5x5" structure on the Cu/Si(111) surface was investigated by sur
face X-ray diffraction that utilized anomalous X-ray scattering by Cu atoms
in part and scanning tunneling microscopy (STM), The X-ray reflectivity cu
rve along the 00 rod was analyzed in the absolute scale to determine not on
ly the vertical heights of the atomic layers of Cu but also the coverage of
Cu atoms. The average interatomic distance of Cu-Cu was estimated by the m
easurement of the anomalous X-ray scattering. Clear STM topographs that are
probably able to explain the origin of the "5x5" structure were taken. The
topograph images also support the results of the X-ray diffraction.