Js. Fang et al., Electric properties of barium-strontium titanate thin films deposited by two-step radio-frequency sputtering, J MATER RES, 16(9), 2001, pp. 2680-2686
Barium-strontium titanate (BST) thin films were prepared by a two-step depo
sition using radio-frequency magnetron sputtering on Pt/Ti/SiO2-buffered Si
(100) substrate. The initial BST layer thickness and intermediate annealing
strongly affect the resultant electric properties of the two-step BST thin
films. The optimal two-step BST films, with a first-layer thickness of 30
nm intermediate annealed at 610 degreesC Under 1 torr oxygen. The dielectri
c breakdown and leakage current density of the two-step film are above 625
kV/cm and 9.5 nA/cm(2) at 100 kV/cm, respectively, compared with 400 kV/cm
and 17 nA/cm(2) for the one-step films. We conclude that the two-step depos
ition dramatically improves dielectric breakdown and enhances leakage curre
nt density while keeping the dielectric constant uninfluenced.