Structural analysis of submicrometer LiCoO2 films (vol 148, pg A311, 2001)

Authors
Bouwman, PJ Boukamp, BA Bouwmeester, HJM Wondergem, HJ Notten, PHL
Citation
Pj. Bouwman et al., Structural analysis of submicrometer LiCoO2 films (vol 148, pg A311, 2001), J ELCHEM SO, 148(9), 2001, pp. L5-L5
Citations number
1
Categorie Soggetti
Physical Chemistry/Chemical Physics","Material Science & Engineering
Journal title
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
ISSN journal
00134651 → ACNP
Volume
148
Issue
9
Year of publication
2001
Pages
L5 - L5
Database
ISI
SICI code
0013-4651(200109)148:9<L5:SAOSLF>2.0.ZU;2-Y