Reflectivity studies on a synchrotron radiation mirror in the hard X-ray regime

Authors
Keil, P Lutzenkirchen-Hecht, D Novikov, DV Hahn, U Frahm, R
Citation
P. Keil et al., Reflectivity studies on a synchrotron radiation mirror in the hard X-ray regime, NUCL INST A, 467, 2001, pp. 275-278
Citations number
11
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
1
Pages
275 - 278
Database
ISI
SICI code
0168-9002(20010721)467:<275:RSOASR>2.0.ZU;2-#
Abstract
The optical performance and roughness parameters of an X-ray mirror that wa s used for several years in a synchrotron radiation beamline are determined by studying its X-ray reflectivity and diffuse scattering behavior. These values are compared to the data derived from topographic measurements with an atomic force microscope (AFM). (C) 2001 Elsevier Science B.V. All rights reserved.