Design and fabrication of aspherical bimorph PZT optics

Citation
Tc. Tseng et al., Design and fabrication of aspherical bimorph PZT optics, NUCL INST A, 467, 2001, pp. 294-297
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
1
Pages
294 - 297
Database
ISI
SICI code
0168-9002(20010721)467:<294:DAFOAB>2.0.ZU;2-L
Abstract
Bimorph piezoelectric optics with a third-order-polynomial surface is desig ned and a prototype is fabricated as active optics. Two pairs of silicon (S i) and lead zirconate titanate (PZT) piezoelectric ceramic are bonded as Si -PZT-PZT-Si together with a multi-electrode or thin film resistor coating u sed as the control electrode between Si and PZT and metallic films as groun ding between the interface of PZT ceramics, A linear voltage is applied to the bimorph PZT optics by probing the control electrodes from a two-channel controllable power supplier. In doing so, the optics surface can achieve a desired third-order-polynomial surface. Reducing hysteresis and creep in b imorph PZT X-ray optics is the only feasible way by inserting an appropriat e capacitor in series with bimorph PZT optics to significantly reduce both effects. (C) 2001 Elsevier Science B.V. All rights reserved.