PLS photoemission electron microscopy beamline

Citation
Th. Kang et al., PLS photoemission electron microscopy beamline, NUCL INST A, 467, 2001, pp. 581-585
Citations number
16
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
1
Pages
581 - 585
Database
ISI
SICI code
0168-9002(20010721)467:<581:PPEMB>2.0.ZU;2-7
Abstract
The performance of a recently commissioned beamline at the Pohang Light Sou rce (PLS) is described. The beamline, which is located at 4B1 at PLS, is a Varied Line Spacing (VLS) Plane Grating Monochromator (PGM) beamline. VLS P GM has become very popular because of the simple scanning mechanism and the fixed exit slit. The beamline which takes 3 mrad horizontal beam fan from bending magnet, covers the energy range 200-1000 eV for Photoemission Elect ron Microscopy (PEEM), X-ray Photoelectron Spectroscopy (XPS) and Magnetic Circular Dichroism (MCD) experiments. Simplicity of the optics and high flu x with medium resolution were the design goals for these applications. The beamline consists of a horizontal focusing mirror, a vertical focusing mirr or, VLS plane grating and exit slit. The source of PLS could be used as a v irtual entrance slit because of its small size and stability. The flux and the resolution of the beamline at the experimental station have been measur ed using an ion chamber and a calibrated photodiode. Test images of PEEM fr om a standard sample were taken to illustrate the further performance of th e beamline and PEEM station. (C) 2001 Elsevier Science B.V. All rights rese rved.