Instrument developments for magnetic and high-resolution diffraction at the XMaS beamline

Citation
Sd. Brown et al., Instrument developments for magnetic and high-resolution diffraction at the XMaS beamline, NUCL INST A, 467, 2001, pp. 727-732
Citations number
5
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
467
Year of publication
2001
Part
1
Pages
727 - 732
Database
ISI
SICI code
0168-9002(20010721)467:<727:IDFMAH>2.0.ZU;2-8
Abstract
The XMaS beamline is situated on dipole BM28 at the European Synchrotron Ra diation Facility (ESRF). It has been designed to perform magnetic and high- resolution diffraction for a British Collaborating Research Group (CRG) ove r an energy range of 3-15 keV in a focused monochromatic beam mode. Since t he beamline became operational in April 1998, various instrument developmen ts have been made. These include both mechanical and opto-mechanical device s of general interest to the SR community, three of which are highlighted i n this paper. Firstly, a motorised x, y, z sample mount capable of holding an APD cryostat has been developed; this device is useful not only for init ial sample alignment, but also in mapping a sample for the location of sing le crystallites. Secondly, novel in-vacuum slits have been developed which allow definition of the beam footprint close to the sample. Thirdly, togeth er with Huber Diffraction GmbH, an in-vacuum polarisation analyser for the analysis of magnetic scattering has been developed. (C) 2001 Elsevier Scien ce B.V. All rights reserved.