Microstructure and structural defects in MgB2 superconductor

Citation
Y. Zhu et al., Microstructure and structural defects in MgB2 superconductor, PHYSICA C, 356(4), 2001, pp. 239-253
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA C
ISSN journal
09214534 → ACNP
Volume
356
Issue
4
Year of publication
2001
Pages
239 - 253
Database
ISI
SICI code
0921-4534(20010801)356:4<239:MASDIM>2.0.ZU;2-9
Abstract
We report a detailed study of the microstructure and defects in sintered po lycrystalline magnesium diboride (MgB2). Both transmission electron microsc opy and X-ray data reveal that MgO is the major second-phase in our bulk sa mples. Although MgB2 and MgO have different crystal symmetries, being P6/mm m and Fm-3m, respectively, their stacking sequence of Mg and B (or O) and l attice spacings in certain crystallographic orientations are very similar. The size of MgO varies from 10-500 nm, and its mismatch with the MgB2 matri x can be a source for dislocations. Dislocations in MgB2 often have a Burge rs vector of < 100 >. 1/3 <1-10 > and 1/3 < 210 > partial dislocations and their associated stacking faults were also observed. Since both dislocation s and stacking faults are located in the (001) basal plane, flux pinning an isotropy is expected. Diffuse scattering analysis suggests that the correla tion length along the c-axis for defect-free basal planes is about 50 nm. ( 001) twist grain boundaries (GBs), formed by rotations along the c-axis, ar e major grain boundaries in MgB2 as a result of the out-of-plane weak bondi ng between Mg and B atoms. An excess of Mg was observed in some grain bound aries. High-resolution nano-probe electron-energy loss spectroscopy reveals that there is a difference in near edge structure of the boron K-edge acqu ired from GBs and grain interiors. The change at the edge threshold may be suggestive of variation of the hole concentration that would significantly alter boundary superconductivity. (C) 2001 Elsevier Science B.V. All rights reserved.