Transient interfacial instability in bilayer polymer films as observed by neutron reflectivity studies

Citation
M. Hayashia et al., Transient interfacial instability in bilayer polymer films as observed by neutron reflectivity studies, POLYMER, 42(24), 2001, pp. 9771-9782
Citations number
37
Categorie Soggetti
Organic Chemistry/Polymer Science
Journal title
POLYMER
ISSN journal
00323861 → ACNP
Volume
42
Issue
24
Year of publication
2001
Pages
9771 - 9782
Database
ISI
SICI code
0032-3861(200111)42:24<9771:TIIIBP>2.0.ZU;2-H
Abstract
Fundamental processes associated with reactive blending were explored for a system composed of polyamide (PA) and deuterated polysulfone having a reac tive phthalic anhydride end group (R) (dPSU-R) diluted with a low molecular weight hydrogenous polysulfone (low-hPSU) by neutron reflectivity (NR). By preparing bilayer films composed of a mixed film of dPSU-R/low-hPSU and a PA film, an intriguing phenomenon was observed in NR studies during the the rmal annealing of the sample. This phenomenon can be described as a transie nt instability of the interface between the PA layer and the dPSU-R/low-hPS U layer during annealing at temperatures high enough to allow chemical reac tions to occur between the dPSU-R end groups and the terminal amino groups of PA, The signature for the interfacial instability was a transient disapp earance of the NR fringes followed by a subsequent recovery of the fringes during additional annealing at high temperatures. The driving force for thi s phenomenon is rapid interdiffusion of a small, low molecular weight fract ion of low-hPSU into the PA layer. A consequence of the rapid interdiffusio n is an attendant Kirkendall shift of the interfacial position as the PSU l ayer shrinks. The magnitude of this special Kirdendall effect accompanying the interfacial instability is directly controlled by the amount of the mis cible low molecular weight fraction of low-hPSU present in the normally imm iscible PSU/PA pair. (C) 2001 Published by Elsevier Science Ltd.