Analyzing issues for 300mm "backend" lithography

Citation
S. Kay et al., Analyzing issues for 300mm "backend" lithography, SOL ST TECH, 44(7), 2001, pp. 138
Citations number
3
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
SOLID STATE TECHNOLOGY
ISSN journal
0038111X → ACNP
Volume
44
Issue
7
Year of publication
2001
Database
ISI
SICI code
0038-111X(200107)44:7<138:AIF3"L>2.0.ZU;2-2
Abstract
With 300mm wafer processing, expect to see a shift from conventional proxim ity aligners to more applications of 1x steppers for backend bump processin g. While passe for leading-edge frontend applications, 1xsteppers provide c lear advantages for semiconductor manufacturing's backend, in cost. of owne rship, automation, and processing. Advantages include broadband exposure, s uperior automatic alignment, and overlay performance. The 2 mum resolution capability of these tools is more than adequate for even difficult bump app lications. In addition, these tools' low 0.16 NA provides a large depth of focus (5.0 mum at the resolution limit of 2.0 mum), which is useful in imag ing thick resist.