Semiconductor compound thin films obtained with capillary evaporators

Citation
Bn. Gritsyuk et al., Semiconductor compound thin films obtained with capillary evaporators, TECH PHYS, 46(9), 2001, pp. 1121-1124
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
TECHNICAL PHYSICS
ISSN journal
10637842 → ACNP
Volume
46
Issue
9
Year of publication
2001
Pages
1121 - 1124
Database
ISI
SICI code
1063-7842(2001)46:9<1121:SCTFOW>2.0.ZU;2-6
Abstract
The thickness of decomposable semiconductor thin films that are obtained wi th capillary evaporators is measured. In the viscous flow approximation, an expression that relates the film thickness, the distance between the capil lary and the deposition area, and the angle between the capillary axis and the flow direction is derived. (C) 2001 MAIK "Nauka/Interperiodica".