Plasma process technology for micromechanic measuring structures

Citation
A. Dehoff et al., Plasma process technology for micromechanic measuring structures, TEC MES, 68(2), 2001, pp. 57-60
Citations number
6
Categorie Soggetti
Instrumentation & Measurement
Journal title
TECHNISCHES MESSEN
ISSN journal
01718096 → ACNP
Volume
68
Issue
2
Year of publication
2001
Pages
57 - 60
Database
ISI
SICI code
0171-8096(200102)68:2<57:PPTFMM>2.0.ZU;2-9
Abstract
Plasma processes are successfully used in the fabrication of mechanical mic rostructures (MEMS). In describing the fabrication of microbeams as test st ructures for an optical 3D inspection system, we present plasma processes f or anisotropic etching of silicon, the deposition of low temperature silico n nitride, and the generation of holographic grids using ion beam etching.