Scattering measurements on optical disks and their relation to media noise

Citation
Xd. Xun et al., Scattering measurements on optical disks and their relation to media noise, APPL OPTICS, 40(26), 2001, pp. 4728-4737
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
40
Issue
26
Year of publication
2001
Pages
4728 - 4737
Database
ISI
SICI code
0003-6935(20010910)40:26<4728:SMOODA>2.0.ZU;2-F
Abstract
We have conducted measurements of scattered light from bare polycarbonate a nd glass substrates and from complete optical disks using a He-Ne laser bea m in different polarization states and at different angles of incidence, Th e results axe compared with the measured media noise obtained from the same disks on a dynamic tester. Both the scattered light and the media noise or iginate from the jaggedness and other imperfections of the groove structure , the roughness of the substrate's surface, and the inhomogeneities of the bulk of the substrate. Although some sources of media noise manifest themse lves in the scattered light distribution, others cannot be easily detected by this type of measurement. (C) 2001 Optical Society of America.