GaN/InGaN light-emitting diodes (LEDs) with different mesa structures are s
tudied. The optical emission power as well as current-voltage characteristi
cs of different mesa patterns are measured. The results show that the optic
al emission of the device with interdigitated patterns is higher than devic
es with traditional square-shaped patterns. The leakage current is found to
increase as the mesa sidewall perimeter increases. Based on the analysis,
it is concluded that a surface leakage current flows across the mesa sidewa
ll and the leakage current is directly proportional to the mesa perimeter.
The implications of the results for large-area scalable LED structures are
discussed. (C) 2001 American Institute of Physics.