Single-crystal aluminum nitride nanomechanical resonators

Citation
An. Cleland et al., Single-crystal aluminum nitride nanomechanical resonators, APPL PHYS L, 79(13), 2001, pp. 2070-2072
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
13
Year of publication
2001
Pages
2070 - 2072
Database
ISI
SICI code
0003-6951(20010924)79:13<2070:SANNR>2.0.ZU;2-A
Abstract
Aluminum nitride is a light, stiff, piezoelectrically active material that can be epitaxially grown on single-crystal Si. AlN is beginning to play a r ole in the integration of semiconducting electronic and surface acoustic wa ve devices, and may prove useful for the integration of other types of mech anical devices as well. We describe the growth and subsequent electron-beam patterning and etching of epitaxial AlN-on-silicon films into nanomechanic al flexural resonators. We have measured resonators with fundamental mechan ical resonance frequencies above 80 MHz, and quality factors in excess of 2 0 000. (C) 2001 American Institute of Physics.