X-ray phase retrieval in high-resolution refraction data from amorphous materials

Authors
Siu, K Nikulin, AY Tamasaku, K Ishikawa, T
Citation
K. Siu et al., X-ray phase retrieval in high-resolution refraction data from amorphous materials, APPL PHYS L, 79(13), 2001, pp. 2112-2114
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
13
Year of publication
2001
Pages
2112 - 2114
Database
ISI
SICI code
0003-6951(20010924)79:13<2112:XPRIHR>2.0.ZU;2-X
Abstract
A recently developed experimental-analytical x-ray diffraction method for t he direct, nondestructive characterization of crystalline materials is appl ied to analyze high-resolution x-ray refraction data from amorphous materia ls. The method uses a logarithmic dispersion relation to determine the x-ra y phase. A priori knowledge of the sample structure is utilized to reconstr uct the physical characteristics of the sample with a resolution of 0.25 mu m. (C) 2001 American Institute of Physics.