Nrs. Farley et al., Dynamic EXAFS study of discharging nickel hydroxide electrode with non-integer Ni valency, ELECTR ACT, 46(20-21), 2001, pp. 3119-3127
A dynamic in situ X-ray absorption study, in the energy dispersive mode, ha
s revealed short-range structural changes taking place during the discharge
of a nickel hydroxide film electrode. A Jahn-Teller distortion has been id
entified in the first Ni-O shell at overcharge, which diminishes during the
discharge process. Throughout discharge, the first Ni-Ni shell moves antag
onistically to Ni-O coordination. These structural changes and Ni K-edge sh
ifts have been used as measures of Ni valency during film discharge. Correl
ation of the results with electrode charge leads to a simple mechanism, in
terms of electron population at Ni sites, for the discharge process. (C) 20
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