A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing

In recent years, the IEEE 1057-94 Standard [1] for specifying and testing m easurement devices based on analog-to-digital converters (ADCs) earned scie ntific interest in several topics. In particular, investigations showed the histogram test of the standard to be insensitive to ADC hysteresis. In thi s paper, an alternative test procedure for determining the dynamic transfer function of an ADC with hysteresis is proposed. The procedure exploits dig ital signal processing to reduce the large amount of data required by the h istogram test. Numerical and experimental results of performance characteri zation, comparison with a state-of-the-art procedure, and noise-sensitivity analysis are presented and discussed.