Measuring mixed-signal substrate coupling

Authors
Rolain, Y Van Moer, W Vandersteen, G van Heijningen, M
Citation
Y. Rolain et al., Measuring mixed-signal substrate coupling, IEEE INSTR, 50(4), 2001, pp. 959-964
Citations number
5
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN journal
00189456 → ACNP
Volume
50
Issue
4
Year of publication
2001
Pages
959 - 964
Database
ISI
SICI code
0018-9456(200108)50:4<959:MMSC>2.0.ZU;2-E
Abstract
A measurement method is proposed to characterize the substrate coupling bet ween digital and analog sections of a mixed-signal CMOS chip. Induced noise and spurious signals can be measured by a custom-designed analog sensor. T his paper proposes a method that, when given such a sensor, allows to measu re the crosstalk between digital and analog chip sections. Calibrated sampl ing scope measurements illustrate the performance of the measurement setup.