Effect of ion beam patterning on the write and read performance of perpendicular granular recording media

We have used a static write-read tester to study the reading and writing of bit patterns on arrays of square bits cut with a focused ion beam into gra nular perpendicular recording media. We have written square-wave bit patter ns on arrays of magnetically isolated islands with periods between 80-248 n m, with the recording linear density matched to this pattern period. These measurements clearly reveal the onset of single domain behavior of the isla nds for periods < 130 nm. We report on variations of read-back signals with this period for bits written in-phase and out-of-phase with the patterning (where bits are written in the center of the islands and lines, respective ly). We also present results and analysis on the effect of patterning and p hase on the transition position jitter.