Arrays of silicon lines covered by a [Co(5)Angstrom /Pt-18 Angstrom] multil
ayer have been studied by soft X-ray Resonant Magnetic Scattering (XRMS). T
he magnetic peaks, which appear at the Co L-3 resonance, reveal the magneti
c periodicity in the array, resulting from the magnetic coupling between th
e top of the lines, with a varying degree of influence from the trenches. I
n agreement with MFM images, the evolution of the magnetic peak intensities
shows that small interline spacings and deep trenches favor antiferromagne
tic order, which can be further reinforced by a specific demagnetization pr
ocess.