A technique for evaluating track deviation at nanometer-scale accuracy

Authors
Yasuna, K Yamaguchi, T Shishida, K Hamaguchi, T
Citation
K. Yasuna et al., A technique for evaluating track deviation at nanometer-scale accuracy, IEEE MAGNET, 37(4), 2001, pp. 1881-1883
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
37
Issue
4
Year of publication
2001
Part
1
Pages
1881 - 1883
Database
ISI
SICI code
0018-9464(200107)37:4<1881:ATFETD>2.0.ZU;2-1
Abstract
A technique for evaluating track deviation in magnetic disk drives has been developed. The technique uses an external position sensor and an error can cellation sequence, and enables measurement of track-to-track spacing. The resolution of track position is less than 2 nm. The repeatability is less t han 5 mn. The technique helps reveal track alignment error, which needs to be reduced to achieve over-100-KTPI recording.