High frequency measurements of CoFeHfO thin films

Citation
Se. Russek et al., High frequency measurements of CoFeHfO thin films, IEEE MAGNET, 37(4), 2001, pp. 2248-2250
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
37
Issue
4
Year of publication
2001
Part
1
Pages
2248 - 2250
Database
ISI
SICI code
0018-9464(200107)37:4<2248:HFMOCT>2.0.ZU;2-D
Abstract
High-frequency measurements of the transverse susceptibility and damping co nstant of CoFeHfO thin films have been made over a frequency range of 0.1 G Hz to 6 GHz as a function of film resistivity, thickness, and temperature. The film resistivity varied from 250 mu Ohm cm to 2100 mu Ohm cm. The films show relatively low damping at high frequencies with the damping constant a ranging from 0.01 to 0.06. The damping constant increases with film resis tivity and, for the highest resistivity films, the damping constant decreas es as the thickness increases. The damping constant, induced anisotropy, an d film resistivity show weak temperature dependence over a temperature rang e from 4 K to 300 K. The low damping constant, in conjunction with the high anisotropy, large resistivity, and large spin-dependent-tunneling magnetor esistance, makes this material attractive for several high-frequency magnet ic device applications.