A new waveform control algorithm for Rotational Single Sheet Testers (RSST)
is presented. The new algorithm achieves circular magnetization for high i
nduction levels even in samples of grain-oriented silicon steel sheets. The
algorithm is based on the circuit model of the system and takes the coupli
ng between the two phases of the RSST into account. Identification of the p
arameters of the measurement setup with the Least Squares (LS) method avoid
s preliminary measurements on the sample and the setup. The performance of
the algorithm is illustrated by measurements on a grain-oriented sample. Th
e algorithm is universally applicable and allows fully automated measuremen
ts.