The measurement method presented here permits the determination of the comp
lex permeability mu* and permittivity epsilon* of rectangular samples of va
rious thicknesses (0.1 mum-1800 mum) over the (130 MHz-7 GHz) frequency ban
d. This method is based on the S-parameters measurements of an asymmetrical
stripline containing the sample under test. It does not require any magnet
ic reference sample. The originality of this method is to reproduce the sam
e environment for the material under test as encountered in microwave devic
es. The results given by this "in situ" measurement technique are more usef
ul to design microwave devices than those given by traditional measurement
methods.