Wavelet-based processing of ECT images for inspection of printed circuit board

This paper presents a wavelet-based image processing technique, which analy zes eddy-current testing (ECT) images derived by scanning printed circuit b oards (PCB's) with an ECT probe and automatically detects the existence and location of the defect. First, the undesired components contained in probe output are removed through two types of wavelet filtering. Then the compar ison of two images obtained from reference and tested PCB's are carried out to extract the signal due to the defect. In this paper, one-dimensional (I -D) wavelet is. used only in the horizontal direction considering that the scanning of the probe is along that direction. In addition, the square norm of difference between original and processed signal is proposed as a crite rion to keep the waveform of the defect peak as possible. The application e xamples of sample PCB's reveal the effectiveness and problems of the given approach.