R. Komanduri et al., Molecular dynamics (MD) simulation of uniaxial tension of some single-crystal cubic metals at nanolevel, INT J MECH, 43(10), 2001, pp. 2237-2260
Molecular Dynamics (MD) simulations of uniaxial tension at nanolevel have b
een carried out at a constant rate of loading (500 m s(-1)) on some single-
crystal cubic metals, both FCC (Al, Cu, and Ni) and BCC (Fe, Cr, and W) to
investigate the nature of deformation and fracture. Failure of the workmate
rials due to void formation, their coalescence into nanocracks, and subsequ
ent fracture or separation were observed similar to their behavior at macro
scale. The engineering stress-strain diagrams obtained by the MD simulation
s of the tensile specimens of various materials show a rapid increase in st
ress up to a maximum followed by a gradual drop to zero when the specimen f
ails by ductile fracture. The radius of the neck is found to increase with
an increase in the deformation of the specimen and to decrease as the ducti
lity of the material decreases. In this investigation, the strain to fractu
re is observed to be lower with the BCC materials than FCC materials. In th
e case of BCC crystals, no distinct linear trend in the engineering stress-
strain characteristics is observed. Instead, rapid fluctuations in the forc
e values were observed. If the drop in the force curves can be attributed t
o the rearrangement of atoms to a new or modified crystalline structure, it
appears that BCC materials undergo a significant change in their structure
and subsequent realignment relative to the FCC materials, as previously re
ported in the literature. While good correlation is found between the D- an
d alpha -parameters of the Morse potential with the ultimate strength and t
he strain to failure for the FCC metals, no such correlation is found for t
he BCC metals. From this, it appears that Morse potentials may not represen
t the deformation behavior of BCC metals as accurately as FCC metals and al
ternate potentials may need to be considered. (C) 2001 Elsevier Science Ltd
. All rights reserved.