UHV magnetic-force microscopy on in situ grown iron-thin films

Citation
J. Losch et al., UHV magnetic-force microscopy on in situ grown iron-thin films, J MAGN MAGN, 226, 2001, pp. 1597-1599
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
ISSN journal
03048853 → ACNP
Volume
226
Year of publication
2001
Part
2
Pages
1597 - 1599
Database
ISI
SICI code
0304-8853(200105)226:<1597:UMMOIS>2.0.ZU;2-M
Abstract
Ultrahigh vacuum (UHV) scanning tunneling microscopy (STM) and magnetic for ce microscopy (MFM) were used to investigate the topography and the magneti c domain structure of epitaxial Fe/Ag thin films. Ten-nanometer thick Fe fi lms were grown on in situ prepared Ag(1 0 0)/Fe/GaAs(I 0 0) substrates. STM images revealed smooth terrace-step structures for the Ag(1 0 0) and the F e(1 0 0) layers. The domain structure mainly consists of 90 degrees domain walls. The density of domains increases significantly close to the sample e dges and a echelon pattern is formed. (C) 2001 Elsevier Science B.V. All ri ghts reserved.