The effect of Zn on the defects in sputter deposited Li-Zn ferrite films

Citation
J. Dash et al., The effect of Zn on the defects in sputter deposited Li-Zn ferrite films, J MAGN MAGN, 226, 2001, pp. 1636-1637
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
ISSN journal
03048853 → ACNP
Volume
226
Year of publication
2001
Part
2
Pages
1636 - 1637
Database
ISI
SICI code
0304-8853(200105)226:<1636:TEOZOT>2.0.ZU;2-L
Abstract
In this paper we report the magnetization as a function of applied field at 300 K and magnetization as a function of temperature for several Li-Zn fer rite thin films with varying Zn content. A molecular field model has been u sed to fit the M vs. T data for both the thin film and the bulk. The magnet ic properties of these thin films are found to be different from that of th e bulk of similar composition. The difference is attributed to the presence of point defects, which leads to paraprocesses, thereby reducing the magne tization of the films. (C) 2001 Elsevier Science B.V. All rights reserved.