Magnetic and structural characterization of CoCrPt and CoCr thin films deposited by magnetron sputtering

Citation
J. Schoenmaker et al., Magnetic and structural characterization of CoCrPt and CoCr thin films deposited by magnetron sputtering, J MAGN MAGN, 226, 2001, pp. 1653-1655
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
ISSN journal
03048853 → ACNP
Volume
226
Year of publication
2001
Part
2
Pages
1653 - 1655
Database
ISI
SICI code
0304-8853(200105)226:<1653:MASCOC>2.0.ZU;2-5
Abstract
The hysteresis loop and the two principal remanence curves of CoCrPt and Co Cr thin films of different compositions are studied. DeltaM curves indicate mainly the presence of weak dipolar intergranular interactions in the magn etic films, and the CoCrPt films show an almost non-interacting behavior. T he crystallographic properties of the CoCrPt films do not seem to explain t he observed enhancement in the magnetic coercivity of the CoCr films with a ddition of Pt. (C) 2001 Published by Elsevier Science B.V.