A circularly polarized X-ray study of the temperature-dependent spin-reorientation transition of thin Co films

Citation
J. Langer et al., A circularly polarized X-ray study of the temperature-dependent spin-reorientation transition of thin Co films, J MAGN MAGN, 226, 2001, pp. 1675-1677
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
ISSN journal
03048853 → ACNP
Volume
226
Year of publication
2001
Part
2
Pages
1675 - 1677
Database
ISI
SICI code
0304-8853(200105)226:<1675:ACPXSO>2.0.ZU;2-E
Abstract
Utilizing vector magnetometry by means of X-ray circular dichroism, the tem perature-driven spin reorientation from an in-plane to out-of-plane orienta tion in thin Co films is studied in an epitaxially grown Au/Co/Au trilayer with decreasing temperature. Probing the remanent state by changing the pho ton helicity provides evidence for a smooth transition and the formation of a metastable magnetic multi-domain state at temperatures below the transit ion temperature. (C) 2001 Elsevier Science B.V. All rights reserved.