Test of the domain wall model on ferromagnetic resonance in NiFe/NiO exchange biased films

Citation
Ma. Lucena et al., Test of the domain wall model on ferromagnetic resonance in NiFe/NiO exchange biased films, J MAGN MAGN, 226, 2001, pp. 1681-1682
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
ISSN journal
03048853 → ACNP
Volume
226
Year of publication
2001
Part
2
Pages
1681 - 1682
Database
ISI
SICI code
0304-8853(200105)226:<1681:TOTDWM>2.0.ZU;2-I
Abstract
Ferromagnetic resonance (FMR) is used to investigate NiFe/NiO samples exhib iting the exchange anisotropy effect characteristic of (FM)/(AF) bilayers. The data are interpreted with a model that includes a domain wall in the AF film parallel to the interface. Fit of the model to data yields the exchan ge-coupling field H-E and an effective domain wall field H-W, with H-W cons istently much larger than H-E, indicating that the AF moments are relativel y rigid in the polycrystalline NiO layer. (C) 2001 Elsevier Science B.V. Al l rights reserved.