Ferromagnetic resonance (FMR) is used to investigate NiFe/NiO samples exhib
iting the exchange anisotropy effect characteristic of (FM)/(AF) bilayers.
The data are interpreted with a model that includes a domain wall in the AF
film parallel to the interface. Fit of the model to data yields the exchan
ge-coupling field H-E and an effective domain wall field H-W, with H-W cons
istently much larger than H-E, indicating that the AF moments are relativel
y rigid in the polycrystalline NiO layer. (C) 2001 Elsevier Science B.V. Al
l rights reserved.