Test of the domain wall model on ferromagnetic resonance in NiFe/NiO exchange biased films

Ferromagnetic resonance (FMR) is used to investigate NiFe/NiO samples exhib iting the exchange anisotropy effect characteristic of (FM)/(AF) bilayers. The data are interpreted with a model that includes a domain wall in the AF film parallel to the interface. Fit of the model to data yields the exchan ge-coupling field H-E and an effective domain wall field H-W, with H-W cons istently much larger than H-E, indicating that the AF moments are relativel y rigid in the polycrystalline NiO layer. (C) 2001 Elsevier Science B.V. Al l rights reserved.