Surface analysis of different wood species using X-ray photoelectron spectroscopy (XPS)

X-ray photoelectron spectroscopy (XPS) was used to characterize the surface s of mechanically treated wood. Microtomed and sanded surfaces of spruce, l arch, beech and oak were investigated. Changes due to the sanding process w ere identified from the survey spectra as well as from the detailed C1s spe ctra. The changes were quantified with the atomic ratio of oxygen to carbon and with a detailed analysis of the contributions to the C1s peak. The ide ntified changes were explained in terms of the macromolecular wood substanc es and in terms of density and the amount of extractives. (C) 2001 Kluwer A cademic Publishers.