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ITA
ENG
In situ high-temperature X-ray diffraction studies of mixed-conducting perovskite-type oxides
Authors
Li, SG
Xu, NP
Shi, J
Hu, MZC
Payzant, EA
Citation
Sg. Li et al., In situ high-temperature X-ray diffraction studies of mixed-conducting perovskite-type oxides, J MAT SCI L, 20(17), 2001, pp. 1631-1633
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 →
ACNP
Volume
20
Issue
17
Year of publication
2001
Pages
1631 - 1633
Database
ISI
SICI code
0261-8028(2001)20:17<1631:ISHXDS>2.0.ZU;2-D