Improved sensitivity in the thermal investigation of polymeric nanophases by measuring the resonance frequency shift using an atomic force microscope

A novel technique has been developed to measure thermal transitions of poly mers with the atomic force microscope (AFM) in the non-contact mode. The re sonance frequency of the AFM cantilever is measured as a function of the te mperature, and thermal transitions of a polymer are clearly visible as chan ges in the resonance frequency/temperature response curve. Using the AFM in this mode allows the determination of the thermal properties of a material at a specific spot on the sample, on a macromolecular scale. This adds a n ew dimension to the standard thermal analysis techniques, rendering it poss ible to resolve the individual thermal transitions of different polymer pha ses, for example in structured multiphase polymers.