Method for manufacturing of double-bent X-ray optics

Citation
Ad. Akhsakhalyan et al., Method for manufacturing of double-bent X-ray optics, NUCL INST A, 470(1-2), 2001, pp. 142-144
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
470
Issue
1-2
Year of publication
2001
Pages
142 - 144
Database
ISI
SICI code
0168-9002(20010901)470:1-2<142:MFMODX>2.0.ZU;2-S
Abstract
A method for manufacturing of double-bent X-ray optics is described. Sample s of spherical silicon crystals with a deviation of the local angles to the surface from the reference ones Delta alpha less than or equal to 0.05 mra d have been fabricated by this method. The minimum radius of curvature of t he samples is R = 1 m for the maximum aperture D = 80 mm. (C) 2001 Elsevier Science B.V. All rights reserved.