Absolute calibration of X-ray semiconductor detectors in the 0.3-1.5 keV photon energy range on synchrotron radiation from VEPP-2M storage ring

The paper presents the results of absolute spectral responsivity measuremen ts for SPPD11 and SPPD11-04 pulse-type silicon detectors, carried out in th e X-ray energy range from 0.3 to 1.5 keV with a relative uncertainty of abo ut 8% (1 sigma). The measurements were performed using the detector exposur e to a well-calculable synchrotron radiation through the selective filters with well-known transmittance. Synchrotron radiation from the VEPP-2M stora ge ring was utilized for these measurements. The spectral responsivity of t he detectors was restored by solving the proper system of integral equation s on the base of measurement data. For increasing the calibration accuracy, the X-ray transmittance near the L-absorption edges of the filters used an d the angular spread in the positron beam of the storage ring were experime ntally determined. (C) 2001 Elsevier Science B.V. All rights reserved.